IEEE Trans. Ultrason., Ferroelect., Freq. Contr. 66(4):761–771 Jan 10, 2019
Christian Kupsch, David Weik, Lukas Feierabend, Richard Nauber, Lars Buttner, Jurgen Czarske
IEEE Trans. Ultrason., Ferroelect., Freq. Contr. 66(4):761–771 Jan 10, 2019